DTIC ADA400739: Future TCAD System for Nanometer-Scale-Device Manufacturing Using Plasma Etching
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DTIC ADA400739: Future TCAD System for Nanometer-Scale-Device Manufacturing Using Plasma Etching
- Publication date
- 2000-07-09
- Topics
- DTIC Archive, Makabe, Toshiaki, KEIO UNIV TOKYO (JAPAN) DEPT OF ELECTRICAL ENGINEERING, *COMPUTER AIDED DESIGN, *COMPUTER AIDED MANUFACTURING, INTEGRATED SYSTEMS, DAMAGE, PREDICTIONS, PLASMAS(PHYSICS), ETCHING, ELECTRICAL PROPERTIES, CROSSLINKING(CHEMISTRY), ELECTRICAL EQUIPMENT,
- Collection
- dticarchive; additional_collections
- Language
- English
The present stage of a series of numerical modelings of the plasma etching processes is overviewed. Physical, chemical and electrical linkage among modules describing low temperature plasma structure/ function in a reactor, the profile and local charging evolution in a hole/trench, and electrical device damage during etching will make it possible to prepare a technology computer aided design (TCAD) for the practical purpose of prediction and designing the etching process. This system will also help to determine device arrangement and size in system on a chip (SoC) in a closed integration system. TCAD will also provide a tool for discussing the etching processes between process engineers and device designers in the age of nanometer-scale device technology.
- Addeddate
- 2018-05-06 09:39:06
- Foldoutcount
- 0
- Identifier
- DTIC_ADA400739
- Identifier-ark
- ark:/13960/t17m71x0m
- Ocr_converted
- abbyy-to-hocr 1.1.37
- Ocr_module_version
- 0.0.21
- Page_number_confidence
- 56
- Page_number_module_version
- 1.0.3
- Pages
- 12
- Pdf_module_version
- 0.0.23
- Ppi
- 300
- Year
- 2000
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